502 search results - page 1 / 101 » Test pattern generation based on arithmetic operations |
ICCAD
1994
IEEE
13 years 8 months ago
1994
IEEE
Existing built-in self test (BIST) strategies require the use of specialized test pattern generation hardware which introduces signi cant area overhead and performance degradation...
EURODAC
1994
IEEE
13 years 8 months ago
1994
IEEE
This paper presents an algorithm for generation of test patterns for strong robust path delay faults, i.e. tests that propagate the fault along a single path and additionally are ...
ARITH
1999
IEEE
13 years 8 months ago
1999
IEEE
Comprehensive testing of any implementation of the RSA cryptosystem requires the use of a number of moduli with specific properties. It is shown how to generate a sufficient varie...
CORR
2010
Springer
13 years 1 months ago
2010
Springer
In the paper, an evolutionary approach to test generation for functional BIST is considered. The aim of the proposed scheme is to minimize the test data volume by allowing the dev...
GECCO
2010
Springer
13 years 7 months ago
2010
Springer
We use affine arithmetic to improve both the performance and the robustness of genetic programming for symbolic regression. During evolution, we use affine arithmetic to analyze e...