26 search results - page 3 / 6 » Testing Configurable LUT-Based FPGAs |
ICCD
2005
IEEE
14 years 2 months ago
2005
IEEE
FPGAs (Field-Programmable Gate Arrays) are often used as coprocessors to boost the performance of dataintensive applications [1, 2]. However, mapping algorithms onto multimillion-...
APCCAS
2006
IEEE
13 years 7 months ago
2006
IEEE
Abstract-- Multi-context FPGAs (MC-FPGAs) have multiple memory bits per configuration bit forming configuration planes for fast switching between contexts. The additional memory pl...
CSREAESA
2010
13 years 3 months ago
2010
The primary goal of Built-In Self-Test (BIST) for Field Programmable Gate Arrays (FPGAs) is to completely test all programmable logic and routing resources in the device such that ...
ITC
1998
IEEE
13 years 10 months ago
1998
IEEE
: We introduce the first BIST approach for testing the programmable routing network in FPGAs. Our method detects opens in, and shorts among, wiring segments, and also faults affect...
ET
2006
13 years 5 months ago
2006
We present an efficient built-in self-test (BIST) architecture for testing and diagnosing stuck-at faults, delay faults, and bridging faults in FPGA interconnect resources. The BIS...