30 search results - page 2 / 6 » Testing Static and Dynamic Faults in Random Access Memories |
VLSID
2009
IEEE
14 years 5 months ago
2009
IEEE
Abstract-- Single-ended static random access memory (SESRAM) is well known for their tremendous potential of low active power and leakage dissipations. In this paper, we present a ...
DFT
1999
IEEE
13 years 9 months ago
1999
IEEE
In this paper, we present a memory fault simulator called the Random Access Memory Simulator for Error Screening (RAMSES). Although it was designed based on some wellknown memory ...
CATA
2009
13 years 6 months ago
2009
ABSTRACT: We present a Built-In Self-Test (BIST) approach for programmable embedded memories in Xilinx Virtex-4 Field Programmable Gate Arrays (FPGAs). The target resources are the...
WADS
2009
Springer
13 years 11 months ago
2009
Springer
Abstract. Algorithms dealing with massive data sets are usually designed for I/O-efficiency, often captured by the I/O model by Aggarwal and Vitter. Another aspect of dealing with ...
KBSE
2007
IEEE
13 years 11 months ago
2007
IEEE
Programs written in languages that provide direct access to memory through pointers often contain memory-related faults, which may cause non-deterministic failures and even securi...