47 search results - page 2 / 10 » Testing and built-in self-test - A survey |
VTS
2005
IEEE
13 years 10 months ago
2005
IEEE
This paper presents the design of an on-chip spectrum analyzer. A novel architecture is used to mitigate the problems encountered in trying to implement architectures employed in ...
VTS
1998
IEEE
13 years 9 months ago
1998
IEEE
This paper presents a BIST architecture for Finite State Machines that exploits Cellular Automata (CA) as pattern generators and signature analyzers. The main advantage of the pro...
CSREAESA
2006
13 years 6 months ago
2006
Abstract
JISE
2011
13 years 7 days ago
2011
DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
Abstract—Built-In Self-Test (BIST) is less often applied to random logic than to embedded memories due to the following reasons: Firstly, for a satisfiable fault coverage it may...