11 search results - page 1 / 3 » Testing for Missing-Gate Faults in Reversible Circuits |
ATS
2004
IEEE
13 years 8 months ago
2004
IEEE
Logical reversibility occurs in low-power applications and is an essential feature of quantum circuits. Of special interest are reversible circuits constructed from a class of rev...
VTS
2003
IEEE
13 years 10 months ago
2003
IEEE
Irreversible computation necessarily results in energy dissipation due to information loss. While small in comparison to the power consumption of today’s VLSI circuits, if curre...
ISAAC
2007
Springer
13 years 11 months ago
2007
Springer
This paper shows that it is NP-hard to generate a minimum complete test set for stuck-at faults on the wires of a reversible circuit. We also show non-trivial lower bounds for the ...
ASPDAC
2006
ACM
13 years 11 months ago
2006
ACM
Abstract— Substantial attention is being paid to the fault diagnosis problem in recent test literature. Yet, the compaction of test vectors for fault diagnosis is little explored...
ICCD
2006
IEEE
14 years 1 months ago
2006
IEEE
— We have entered an era where chip yields are decreasing with scaling. A new concept called intelligible testing has been previously proposed with the goal of reversing this tre...