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» The Test Ability of an Adaptive Pulse Wave for ADC Testing
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ATS
2010
IEEE
261views Hardware» more  ATS 2010»
13 years 2 months ago
The Test Ability of an Adaptive Pulse Wave for ADC Testing
In the conventional ADC production test method, a high-quality analogue sine wave is applied to the Analogue-toDigital Converter (ADC), which is expensive to generate. Nowadays, an...
Xiaoqin Sheng, Hans G. Kerkhoff
ETS
2010
IEEE
150views Hardware» more  ETS 2010»
13 years 3 months ago
Predicting dynamic specifications of ADCs with a low-quality digital input signal
— A new method is presented to test dynamic parameters of Analogue-to-Digital Converters (ADC). A noisy and nonlinear pulse is applied as the test stimulus, which is suitable for...
Xiaoqin Sheng, Vincent Kerzerho, Hans G. Kerkhoff
ETS
2009
IEEE
128views Hardware» more  ETS 2009»
13 years 2 months ago
Algorithms for ADC Multi-site Test with Digital Input Stimulus
This paper reports two novel algorithms based on time-modulo reconstruction method intended for detection of the parametric faults in analogue-to-digital converters (ADC). In both ...
Xiaoqin Sheng, Hans G. Kerkhoff, Amir Zjajo, Guido...