Some weak static CMOS chips can be detected by testing them with a very low supply voltage -- between 2 and 2.5 times the threshold voltage Vt of the transistors. A weak chip is o...
For statistical timing and power analysis that are very important problems in the sub-100nm technologies, stochastic analysis of power grids that characterizes the voltage fluctua...
Praveen Ghanta, Sarma B. K. Vrudhula, Sarvesh Bhar...
One of the fundamental problems in Deep Sub Micron (DSM) circuits is Simultaneous Switching Noise (SSN), which causes voltage fluctuations in the circuit power/ground networks. In...
The objective of this paper is to suggest a systematic means by which the timing and focus of information technology policies can be used to optimize supply chain performance and ...
As microprocessors become increasingly complex, the techniques used to analyze and predict their behavior must become increasingly rigorous. This paper applies wavelet analysis te...