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VTS
1996
IEEE
114views Hardware» more  VTS 1996»
13 years 10 months ago
Quantitative analysis of very-low-voltage testing
Some weak static CMOS chips can be detected by testing them with a very low supply voltage -- between 2 and 2.5 times the threshold voltage Vt of the transistors. A weak chip is o...
Jonathan T.-Y. Chang, Edward J. McCluskey
DAC
2006
ACM
14 years 7 months ago
Stochastic variational analysis of large power grids considering intra-die correlations
For statistical timing and power analysis that are very important problems in the sub-100nm technologies, stochastic analysis of power grids that characterizes the voltage fluctua...
Praveen Ghanta, Sarma B. K. Vrudhula, Sarvesh Bhar...
GLVLSI
2003
IEEE
146views VLSI» more  GLVLSI 2003»
13 years 11 months ago
A practical CAD technique for reducing power/ground noise in DSM circuits
One of the fundamental problems in Deep Sub Micron (DSM) circuits is Simultaneous Switching Noise (SSN), which causes voltage fluctuations in the circuit power/ground networks. In...
Arindam Mukherjee, Krishna Reddy Dusety, Rajsaktis...
HICSS
2007
IEEE
151views Biometrics» more  HICSS 2007»
14 years 15 days ago
The Impact of Information Technology on the Temporal Optimization of Supply Chain Performance
The objective of this paper is to suggest a systematic means by which the timing and focus of information technology policies can be used to optimize supply chain performance and ...
Ken Dozier, David Chang
HPCA
2004
IEEE
14 years 6 months ago
Wavelet Analysis for Microprocessor Design: Experiences with Wavelet-Based dI/dt Characterization
As microprocessors become increasingly complex, the techniques used to analyze and predict their behavior must become increasingly rigorous. This paper applies wavelet analysis te...
Russ Joseph, Zhigang Hu, Margaret Martonosi