55 search results - page 11 / 11 » Tolerating Radiation-Induced Transient Faults in Modern Proc... |
DFT
2006
IEEE
13 years 12 months ago
2006
IEEE
Dual core architectures are commonly used to establish fault tolerance on the node level. Since comparison is usually performed for the outputs only, no precise diagnostic informa...
DATE
2008
IEEE
14 years 7 days ago
2008
IEEE
We expect that in future commodity hardware will be used in safety critical applications. But the used commodity microprocessors will become less reliable because of decreasing fe...
IEEEPACT
2007
IEEE
14 years 2 days ago
2007
IEEE
Under current worst-case design practices, manufacturers specify conservative values for processor frequencies in order to guarantee correctness. To recover some of the lost perfo...
IPPS
1998
IEEE
13 years 10 months ago
1998
IEEE
A real-time system must execute functionally correct computations in a timely manner. In order to guarantee that all tasks accepted in the system will meet their timing requiremen...
DSN
2007
IEEE
14 years 3 days ago
2007
IEEE
Aggressive CMOS scaling will make future chip multiprocessors (CMPs) increasingly susceptible to transient faults, hard errors, manufacturing defects, and process variations. Exis...