22 search results - page 2 / 5 » Trading off Reliability and Power-Consumption in Ultra-low P... |
ASPDAC
2010
ACM
13 years 3 months ago
2010
ACM
Modern digital IC designs have a critical operating point, or "wall of slack", that limits voltage scaling. Even with an errortolerance mechanism, scaling voltage below a...
ASPDAC
2006
ACM
13 years 9 months ago
2006
ACM
Thermal effects are becoming increasingly important during integrated circuit design. Thermal characteristics influence reliability, power consumption, cooling costs, and performan...
ICC
2007
IEEE
14 years 3 days ago
2007
IEEE
— Transferring data reliably from Mars to Earth stations is becoming an appealing challenge in the design of interplanetary networks. In this view, the use of CCSDS-based protoco...
CASES
2009
ACM
13 years 3 months ago
2009
ACM
In this paper we address the issue of making a program reversible in terms of spatial complexity. Spatial complexity is the amount of memory/register locations required for perfor...
MICRO
2009
IEEE
14 years 12 days ago
2009
IEEE
Voltage scaling is one of the most effective mechanisms to reduce microprocessor power consumption. However, the increased severity of manufacturing-induced parameter variations a...