10 search results - page 1 / 2 » Transformed pseudo-random patterns for BIST |
ITC
1995
IEEE
13 years 8 months ago
1995
IEEE
During built-in self-test (BIST), the set of patterns generated by a pseudo-random pattern generator may not provide a sufficiently high fault coverage. This paper presents a new ...
DSD
2007
IEEE
13 years 11 months ago
2007
IEEE
This paper discusses possibilities for a choice of a pseudorandom pattern generator that is to be used in combination with the column-matching based built-in self-test design meth...
MTDT
2000
IEEE
13 years 9 months ago
2000
IEEE
In this work, we present the application of Generalized Linear Feedback Shift Registers (GLFSRs) for generation of patterns for pseudo-random memory Built-In SelfTest (BIST). Rece...
DSD
2005
IEEE
13 years 6 months ago
2005
IEEE
Several methods improving the fault coverage in mixed-mode BIST are presented in this paper. The test is divided into two phases: the pseudo-random and deterministic. Maximum of f...
IOLTS
2000
IEEE
13 years 9 months ago
2000
IEEE
The combination of higher quality requirements and sensitivity of high performance circuits to delay defects has led to an increasing emphasis on delay testing of VLSI circuits. A...