18 search results - page 1 / 4 » Transient fault detection via simultaneous multithreading |
ISCA
2000
IEEE
13 years 9 months ago
2000
IEEE
Smaller feature sizes, reduced voltage levels, higher transistor counts, and reduced noise margins make future generations of microprocessors increasingly prone to transient hardw...
ISCA
2002
IEEE
13 years 9 months ago
2002
IEEE
We propose a scheme for transient-fault recovery called Simultaneously and Redundantly Threaded processors with Recovery (SRTR) that enhances a previously proposed scheme for tran...
DSN
2007
IEEE
13 years 11 months ago
2007
IEEE
Transient faults are emerging as a critical concern in the reliability of general-purpose microprocessors. As architectural trends point towards multi-threaded multi-core designs,...
ISCA
2002
IEEE
13 years 9 months ago
2002
IEEE
Exponential growth in the number of on-chip transistors, coupled with reductions in voltage levels, makes each generation of microprocessors increasingly vulnerable to transient f...
IPPS
2006
IEEE
13 years 11 months ago
2006
IEEE
The performance requirements for contemporary microprocessors are increasing as rapidly as their number of applications grows. By accelerating the clock, performance can be gained...