21 search results - page 2 / 5 » Transistor-level based defect tolerance for reliable nanoele... |
ET
2007
13 years 5 months ago
2007
In this paper, we focus on reliability, one of the most fundamental and important challenges, in the nanoelectronics environment. For a processor architecture based on the unreliab...
ISQED
2009
IEEE
14 years 4 days ago
2009
IEEE
Abstract — Nanoelectronic design faces unprecedented reliability challenges and must achieve noise immunity and delay insensitiveness in the presence of prevalent defects and sig...
VLSID
2004
IEEE
14 years 5 months ago
2004
IEEE
As we move from deep submicron technology to nanotechnology for device manufacture, the need for defect-tolerant architectures is gaining importance. This is because, at the nanos...
FPGA
2006
ACM
13 years 9 months ago
2006
ACM
This report describes a preliminary evaluation of possible performance of an FPGA-like architecture for future hybrid "CMOL" circuits which combine a semiconductor-trans...
ICCAD
2008
IEEE
14 years 2 months ago
2008
IEEE
—When manufacturing nano-devices, defects are a certainty and reliability becomes a critical issue. Until now, the most pervasive methods used to address reliability, involve inj...