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» Universal Test Sets for Reversible Circuits
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COCOON
2010
Springer
13 years 9 months ago
Universal Test Sets for Reversible Circuits
Satoshi Tayu, Shota Fukuyama, Shuichi Ueno
VTS
2003
IEEE
115views Hardware» more  VTS 2003»
13 years 10 months ago
Fault Testing for Reversible Circuits
Irreversible computation necessarily results in energy dissipation due to information loss. While small in comparison to the power consumption of today’s VLSI circuits, if curre...
Ketan N. Patel, John P. Hayes, Igor L. Markov
ISAAC
2007
Springer
131views Algorithms» more  ISAAC 2007»
13 years 10 months ago
On the Fault Testing for Reversible Circuits
This paper shows that it is NP-hard to generate a minimum complete test set for stuck-at faults on the wires of a reversible circuit. We also show non-trivial lower bounds for the ...
Satoshi Tayu, Shigeru Ito, Shuichi Ueno
ATS
2004
IEEE
116views Hardware» more  ATS 2004»
13 years 8 months ago
Testing for Missing-Gate Faults in Reversible Circuits
Logical reversibility occurs in low-power applications and is an essential feature of quantum circuits. Of special interest are reversible circuits constructed from a class of rev...
John P. Hayes, Ilia Polian, Bernd Becker
GLVLSI
2010
IEEE
209views VLSI» more  GLVLSI 2010»
13 years 9 months ago
Enhancing debugging of multiple missing control errors in reversible logic
Researchers are looking for alternatives to overcome the upcoming limits of conventional hardware technologies. Reversible logic thereby established itself as a promising directio...
Jean Christoph Jung, Stefan Frehse, Robert Wille, ...