58 search results - page 1 / 12 » Using a single input to support multiple scan chains |
ICCAD
1998
IEEE
13 years 9 months ago
1998
IEEE
ICCAD
2007
IEEE
14 years 2 months ago
2007
IEEE
— This paper proposes a selective pattern-compression scheme to minimize both test power and test data volume during scan-based testing. The proposed scheme will selectively supp...
ISQED
2006
IEEE
13 years 11 months ago
2006
IEEE
— With advanced VLSI manufacturing technology in deep submicron (DSM) regime, we can integrate entire electronic systems on a single chip (SoC). Due to the complexity in SoC desi...
EDBT
2006
ACM
14 years 5 months ago
2006
ACM
Abstract. Many different index structures have been proposed for spatial databases to support efficient query processing. However, most of these index structures suffer from an exp...
SGP
2007
13 years 7 months ago
2007
We present an example-based surface reconstruction method for scanned point sets. Our approach uses a database of local shape priors built from a set of given context models that ...