7 search results - page 1 / 2 » Variation Impact on SER of Combinational Circuits |
ISQED
2007
IEEE
13 years 11 months ago
2007
IEEE
DAC
2006
ACM
14 years 5 months ago
2006
ACM
Due to the shrinking of feature size and reduction in supply voltages, nanoscale circuits have become more susceptible to radiation induced transient faults. In this paper, we pre...
DAC
2007
ACM
14 years 5 months ago
2007
ACM
Process variation has become a critical problem in modern VLSI fabrication. In the presence of process variation, buffer insertion problem under performance constraints becomes mo...
TVLSI
2010
12 years 11 months ago
2010
Abstract-- The operational characteristics of integrated circuits based on nanoscale semiconductor technology are expected to be increasingly affected by variations in the manufact...
ISLPED
2006
ACM
13 years 11 months ago
2006
ACM
Process variations will increasingly impact the operational characteristics of integrated circuits in nanoscale semiconductor technologies. Researchers have proposed various desig...