1192 search results - page 2 / 239 » Variation-Aware Fault Modeling |
TVLSI
2008
13 years 4 months ago
2008
Abstract--Technology scaling in the nanometer era has increased the transistor's susceptibility to process variations. The effects of such variations are having a huge impact ...
TVLSI
2010
12 years 11 months ago
2010
Abstract-- The operational characteristics of integrated circuits based on nanoscale semiconductor technology are expected to be increasingly affected by variations in the manufact...
FDTC
2011
Springer
12 years 4 months ago
2011
Springer
Abstract—The literature about fault analysis typically describes fault injection mechanisms, e.g. glitches and lasers, and cryptanalytic techniques to exploit faults based on som...
ET
2010
13 years 2 months ago
2010
This work justifies several quantum gate level fault models and discusses the causal error mechanisms thwarting correct function. A quantum adaptation of the classical test set gen...
DATE
2006
IEEE
13 years 10 months ago
2006
IEEE
Generation of n -detection test sets is typically done for a single fault model. In this work we investigate the generation of n -detection test sets by pairing each fault of a ta...