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GLVLSI
2008
IEEE
129views VLSI» more  GLVLSI 2008»
13 years 11 months ago
Variational capacitance modeling using orthogonal polynomial method
In this paper, we propose a novel statistical capacitance extraction method for interconnects considering process variations. The new method, called statCap, is based on the spect...
Jian Cui, Gengsheng Chen, Ruijing Shen, Sheldon X....
DAC
2009
ACM
13 years 11 months ago
Variational capacitance extraction of on-chip interconnects based on continuous surface model
In this paper we present a continuous surface model to describe the interconnect geometric variation, which improves the currently used model for better accuracy while not increas...
Wenjian Yu, Chao Hu, Wangyang Zhang
DATE
2010
IEEE
140views Hardware» more  DATE 2010»
13 years 9 months ago
Variation-aware interconnect extraction using statistical moment preserving model order reduction
—1 In this paper we present a stochastic model order reduction technique for interconnect extraction in the presence of process variabilities, i.e. variation-aware extraction. It...
Tarek A. El-Moselhy, Luca Daniel
DAC
2009
ACM
13 years 11 months ago
PiCAP: a parallel and incremental capacitance extraction considering stochastic process variation
It is unknown how to include stochastic process variation into fast-multipole-method (FMM) for a full chip capacitance extraction. This paper presents a parallel FMM extraction us...
Fang Gong, Hao Yu, Lei He
ASPDAC
2009
ACM
143views Hardware» more  ASPDAC 2009»
13 years 11 months ago
Statistical modeling and analysis of chip-level leakage power by spectral stochastic method
In this paper, we present a novel statistical full-chip leakage power analysis method. The new method can provide a general framework to derive the full-chip leakage current or po...
Ruijing Shen, Ning Mi, Sheldon X.-D. Tan, Yici Cai...