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FORMATS
2006
Springer
13 years 8 months ago
Verification of the Generic Architecture of a Memory Circuit Using Parametric Timed Automata
Using a variant of Clariso-Cortadella's parametric method for verifying asynchronous circuits, we formally derive a set of linear constraints that ensure the correctness of so...
Remy Chevallier, Emmanuelle Encrenaz-Tiphèn...
ENTCS
2006
185views more  ENTCS 2006»
13 years 4 months ago
Time Domain Verification of Oscillator Circuit Properties
The application of formal methods to analog and mixed signal circuits requires efficient methods tructing abstractions of circuit behaviors. This paper concerns the verification o...
Goran Frehse, Bruce H. Krogh, Rob A. Rutenbar, Ode...
DAC
2006
ACM
14 years 5 months ago
Criticality computation in parameterized statistical timing
Chips manufactured in 90 nm technology have shown large parametric variations, and a worsening trend is predicted. These parametric variations make circuit optimization difficult ...
Jinjun Xiong, Vladimir Zolotov, Natesan Venkateswa...
EURODAC
1994
IEEE
209views VHDL» more  EURODAC 1994»
13 years 9 months ago
MOS VLSI circuit simulation by hardware accelerator using semi-natural models
- The accelerator is destined to circuit-level simulation of digital and analog/digital MOS VLSI'c containing of up to 100 thousand transistors (with 16 Mb RAM host-machine). ...
Victor V. Denisenko
DDECS
2007
IEEE
201views Hardware» more  DDECS 2007»
13 years 11 months ago
Built in Defect Prognosis for Embedded Memories
: As scan compression replaces the traditional scan it is important to understand how it works with power. DFT MAX represents one of the two primary scan compression solutions used...
Prashant Dubey, Akhil Garg, Sravan Kumar Bhaskaran...