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ISCAS
2005
IEEE
131views Hardware» more  ISCAS 2005»
13 years 10 months ago
Timing yield estimation using statistical static timing analysis
—As process variations become a significant problem in deep sub-micron technology, a shift from deterministic static timing analysis to statistical static timing analysis for hig...
Min Pan, Chris C. N. Chu, Hai Zhou
ASYNC
2007
IEEE
132views Hardware» more  ASYNC 2007»
13 years 11 months ago
Area Optimizations for Dual-Rail Circuits Using Relative-Timing Analysis
Future deep sub-micron technologies will be characterized by large parametric variations, which could make asynchronous design an attractive solution for use on large scale. Howev...
Tiberiu Chelcea, Girish Venkataramani, Seth Copen ...
FPGA
2010
ACM
250views FPGA» more  FPGA 2010»
14 years 1 months ago
Variation-aware placement for FPGAs with multi-cycle statistical timing analysis
Deep submicron processes have allowed FPGAs to grow in complexity and speed. However, such technology scaling has caused FPGAs to become more susceptible to the effects of process...
Gregory Lucas, Chen Dong, Deming Chen
TCAD
2002
99views more  TCAD 2002»
13 years 4 months ago
Analysis of on-chip inductance effects for distributed RLC interconnects
This paper introduces an accurate analysis of on-chip inductance effects for distributed interconnects that takes the effect of both the series resistance and the output parasitic ...
Kaustav Banerjee, Amit Mehrotra
ICCAD
1997
IEEE
137views Hardware» more  ICCAD 1997»
13 years 8 months ago
Optimization techniques for high-performance digital circuits
The relentless push for high performance in custom digital circuits has led to renewed emphasis on circuit optimization or tuning. The parameters of the optimization are typically...
Chandramouli Visweswariah