9 search results - page 1 / 2 » Yield enhancements of design-specific FPGAs |
FPGA
2006
ACM
13 years 8 months ago
2006
ACM
The high unit cost of FPGA devices often deters their use beyond the prototyping stage. Efforts have been made to reduce the part-cost of FPGA devices, resulting in the developmen...
FPL
2005
Springer
13 years 10 months ago
2005
Springer
This paper presents a revised model for the yield analysis of FPGA interconnect layers. Based on proven yield models, this work improves the predictions and assumptions of previous...
FPL
2005
Springer
13 years 10 months ago
2005
Springer
Future process nodes have such small feature sizes that there will be an increase in the number of manufacturing defects per die. For large FPGAs, it will be critical to tolerate ...
DATE
2005
IEEE
13 years 10 months ago
2005
IEEE
attributed to the high regularity of memories, PAs and FPGAs, and the ease with which they can be tested and reconfigured to avoid faulty elements. Digital microfluidicsbased bioch...
FPGA
2007
ACM
13 years 11 months ago
2007
ACM
Variations in the semiconductor fabrication process results in variability in parameters between transistors on the same die, a problem exacerbated by lithographic scaling. The re...