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ATS
1998
IEEE
13 years 9 months ago
1998
IEEE
In mixed-mode BIST, deterministic test patterns are generated with on-chip hardware to detect the random-pattern-resistant (r.p.r.) faults that are missed by the pseudo-random pat...
ATS
1998
IEEE
13 years 9 months ago
1998
IEEE
We propose a new static test set compaction method based on a careful examination of attributes of fault coverage curves. Our method is based on two key ideas: 1 fault-list and te...
ATS
1998
IEEE
13 years 9 months ago
1998
IEEE
This paper presents a new effective Built-In Self Test (BIST) scheme that achieves 100% fault coverage with low area overhead, and without any modification of the circuit under tes...
TSD
1999
Springer
13 years 9 months ago
1999
Springer
The use of the treebank as a resource for linguistic research has led us to look for an annotation scheme representing not only surface syntactic information (in ‘analytic treesâ...
NAR
1998
13 years 4 months ago
1998
The eighth edition of the haemophilia B database (http://www.umds.ac.uk/molgen/haemBdatabase.htm ) lists in an easily accessible form all known factor IX mutations due to small ch...