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    ATS
    2003
    IEEE
    91views Hardware» more  ATS 2003»
    An On-Chip Jitter Measurement Circuit for the PLL
    13 years 8 months ago
    An On-Chip Jitter Measurement Circuit for the PLL
    Download  nthur.lib.nthu.edu.tw
    Chin-Cheng Tsai, Chung-Len Lee
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    ATS
    2003
    IEEE
    106views Hardware» more  ATS 2003»
    Comparison of Open and Resistive-Open Defect Test Conditions in SRAM Address Decoders
    13 years 9 months ago
    Comparison of Open and Resistive-Open Defect Test Conditions in SRAM Address Decoders
    Download  www.lirmm.fr
    Luigi Dilillo, Patrick Girard, Serge Pravossoudovi...
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    ATS
    2003
    IEEE
    84views Hardware» more  ATS 2003»
    Test Time Minimization for Hybrid BIST of Core-Based Systems
    13 years 9 months ago
    Test Time Minimization for Hybrid BIST of Core-Based Systems
    Download  eprints.ecs.soton.ac.uk
    Gert Jervan, Petru Eles, Zebo Peng, Raimund Ubar, ...
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    ACL
    2003
    114views Computational Linguistics» more  ACL 2003»
    iNeATS: Interactive Multi-Document Summarization
    13 years 6 months ago
    iNeATS: Interactive Multi-Document Summarization
    Download  acl.ldc.upenn.edu
    We describe iNeATS – an interactive multi-document summarization system that integrates a state-of-the-art summarization engine with an advanced user interface. Three main goals...
    Anton Leuski, Chin-Yew Lin, Eduard H. Hovy
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    ITC
    2003
    IEEE
    143views Hardware» more  ITC 2003»
    A Case Study of IR-Drop in Structured At-Speed Testing
    13 years 9 months ago
    A Case Study of IR-Drop in Structured At-Speed Testing
    Download  www.itcprogramdev.org
    At-speed test has become a requirement in IC technologies below 180 nm. Unfortunately, test mode switching activity and IR-drop present special challenges to the successful applic...
    Jayashree Saxena, Kenneth M. Butler, Vinay B. Jaya...
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