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COMPGEOM
2003
ACM
13 years 10 months ago
High-dimensional shape fitting in linear time
Let P be a set of n points in Rd. The radius of a k-dimensional flat F with respect to P, denoted by RD(F, P), is defined to be maxp∈P dist(F, p), where dist(F, p) denotes the...
Sariel Har-Peled, Kasturi R. Varadarajan
ATS
2003
IEEE
151views Hardware» more  ATS 2003»
13 years 10 months ago
BDD Based Synthesis of Symmetric Functions with Full Path-Delay Fault Testability
A new technique for synthesizing totally symmetric Boolean functions is presented that achieves complete robust path delay fault testability. We apply BDDs for the synthesis of sy...
Junhao Shi, Görschwin Fey, Rolf Drechsler
ATS
2003
IEEE
76views Hardware» more  ATS 2003»
13 years 10 months ago
STAGE: A Decoding Engine Suitable for Multi-Compressed Test Data
: Most of the recently discussed test stimulus data compression techniques are based on the low care bit densities found in typical scan test vectors. Data reduction primarily is a...
Bernd Koenemann
ATS
2003
IEEE
93views Hardware» more  ATS 2003»
13 years 10 months ago
Optimal System-on-Chip Test Scheduling
1 In this paper, we show that the scheduling of tests on the test access mechanism (TAM) is equivalent to independent job scheduling on identical machines and we make use of an exi...
Erik Larsson, Hideo Fujiwara
ATS
2003
IEEE
126views Hardware» more  ATS 2003»
13 years 10 months ago
Analyzing the Impact of Process Variations on DRAM Testing Using Border Resistance Traces
Abstract: As a result of variations in the fabrication process, different memory components are produced with different operational characteristics, a situation that complicates th...
Zaid Al-Ars, A. J. van de Goor