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DFT
2004
IEEE
13 years 8 months ago
2004
IEEE
ICCD
2004
IEEE
14 years 1 months ago
2004
IEEE
Increasing system complexity and test cost demands new system-level solutions for mixed-signal systems. In this paper, we present a testability analysis and DfT insertion methodol...
DFT
2004
IEEE
13 years 8 months ago
2004
IEEE
We present a model for computing the probability of a parametric failure due to a spot defect. The analysis is based on electromigration in conductors under unidirectional current...
DFT
2004
IEEE
13 years 8 months ago
2004
IEEE
This paper proposes a test architecture aimed at reducing test time of distributed small embedded SRAMs (eSRAMs). This architecture improves the one proposed in [4, 5]. The improv...
ICIP
2004
IEEE
14 years 6 months ago
2004
IEEE
In this paper, a blind object-based video watermarking scheme, which is robust to MPEG4 compression and normal video editing such as Rotation, Scaling or Translation (RST), is pro...