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DFT
2006
IEEE
143views VLSI» more  DFT 2006»
13 years 11 months ago
Defect Tolerant and Energy Economized DSP Plane of a 3-D Heterogeneous SoC
This paper1 discusses a defect tolerant and energy economized computing array for the DSP plane of a 3-D Heterogeneous System on a Chip. We present the J-platform, which employs c...
Vijay K. Jain, Glenn H. Chapman
DFT
2006
IEEE
148views VLSI» more  DFT 2006»
13 years 7 months ago
Bilateral Testing of Nano-scale Fault-tolerant Circuits
As the technology enters the nano dimension, the inherent unreliability of nanoelectronics is making fault-tolerant architectures increasingly necessary in building nano systems. ...
Lei Fang, Michael S. Hsiao
DFT
2006
IEEE
74views VLSI» more  DFT 2006»
13 years 11 months ago
Recovery Mechanisms for Dual Core Architectures
Dual core architectures are commonly used to establish fault tolerance on the node level. Since comparison is usually performed for the outputs only, no precise diagnostic informa...
Christian El Salloum, Andreas Steininger, Peter Tu...
DFT
2006
IEEE
120views VLSI» more  DFT 2006»
13 years 11 months ago
On-Line Mapping of In-Field Defects in Image Sensor Arrays
Continued increase in complexity of digital image sensors means that defects are more likely to develop in the field, but little concrete information is available on in-field defe...
Jozsef Dudas, Cory Jung, Linda Wu, Glenn H. Chapma...
DFT
2006
IEEE
92views VLSI» more  DFT 2006»
13 years 11 months ago
Low-Cost Hardening of Image Processing Applications Against Soft Errors
Image processing systems are increasingly used in safetycritical applications, and their hardening against soft errors becomes an issue. We propose a methodology to identify soft ...
Ilia Polian, Bernd Becker, Masato Nakasato, Satosh...