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DFT
2008
IEEE
13 years 11 months ago
2008
IEEE
Scan-based debug methods give high observability of internal signals, however, they require halting the system to scan out responses from the circuit-under-debug (CUD). This is ti...
DFT
2008
IEEE
13 years 6 months ago
2008
IEEE
This paper presents a concurrent error detection technique for the control logic of a modern microprocessor. Our method is based on execution time prediction for each instruction ...
DFT
2008
IEEE
13 years 11 months ago
2008
IEEE
Nanoelectronic components are expected to suffer from very high error rates, implying the need for hardening techniques. We propose a fine-grained approach to harden a promising...
DFT
2008
IEEE
13 years 11 months ago
2008
IEEE
Error detection/correction techniques have been advocated for algorithmic self-assembly. Under rectilinear growth, it requires only two additional tiles, generally referred to as ...
DFT
2008
IEEE
13 years 6 months ago
2008
IEEE
This paper addresses a new threat to the security of integrated circuits (ICs). The migration of IC fabrication to untrusted foundries has made ICs vulnerable to malicious alterat...