3 search results - page 1 / 1 » introduction to electromigration-aware physical design |
VLSID
2005
IEEE
14 years 5 months ago
2005
IEEE
The electromigration effect within current-density-stressed signal and power lines is an ubiquitous and increasingly important reliability and design problem in sub-micron IC desi...
ISPD
2006
ACM
13 years 11 months ago
2006
ACM
UPP
2004
Springer
13 years 11 months ago
2004
Springer
Evolving solutions rather than computing them certainly represents an unconventional programming approach. The general methodology of evolutionary computation has already been know...