The Switched-Current SI technique is a circuit method that enables analog sampled-data circuits to be realized with a standard digital CMOS process. At this time it is fair to say...
This paper presents a new sequential decoding algorithm based on dynamic searching strategy to improve decoding efficiency. The searching strategy is to exploit both sorting and p...
This paper presents Resist, a recursive test pattern generation (TPG) algorithm for path delay fault testing of scan-based circuits. In contrast to other approaches, it exploits t...
Undetectable shorts may decrease the long term reliability of a circuit, cause intermittent failures, add noise and delay, or increase test pattern generation costs. This paper de...
Symbolic state space exploration techniques for Finite State Machines (FSMs) are a major recent result in CAD for VLSI. Most of them are exact and based on forward traversal, but ...