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VTS
1996
IEEE
13 years 9 months ago
1996
IEEE
A fault-oriented sequential circuit test generator is described in which various types of distinguishing sequences are derived, both statically and dynamically, to aid the test ge...
ICCAD
1996
IEEE
13 years 9 months ago
1996
IEEE
State justification is a time-consuming operation in test generation for sequential circuits. In this paper, we present a technique to rapidly identify state elements (flip-flops)...
ISCA
1996
IEEE
13 years 9 months ago
1996
IEEE
Parallel workstations, each comprising 10-100 processors, promise cost-effective general-purpose multiprocessing. This paper explores the coupling of such small- to medium-scale s...
ISCA
1996
IEEE
13 years 9 months ago
1996
IEEE
In an effort to push the envelope of system performance, microprocessor designs are continually exploiting higher levels of instruction-level parallelism, resulting in increasing ...
ISCA
1996
IEEE
13 years 9 months ago
1996
IEEE
This paper makes the case that pin bandwidth will be a critical consideration for future microprocessors. We show that many of the techniques used to tolerate growing memory laten...