309 search results - page 61 / 62 » iscas 2007 |
EAAI
2007
13 years 4 months ago
2007
This paper presents a swarm intelligence based approach to optimally partition combinational CMOS circuits for pseudoexhaustive testing. The partitioning algorithm ensures reducti...
ISCA
2007
IEEE
13 years 11 months ago
2007
IEEE
Much like multi-storey buildings in densely packed metropolises, three-dimensional (3D) chip structures are envisioned as a viable solution to skyrocketing transistor densities an...
ICCAD
2007
IEEE
14 years 1 months ago
2007
IEEE
Functional dependency is concerned with rewriting a Boolean function f as a function h over a set of base functions {g1, …, gn}, i.e. f = h(g1, …, gn). It plays an important r...
IOLTS
2007
IEEE
13 years 11 months ago
2007
IEEE
— Soft errors caused by ionizing radiation have emerged as a major concern for current generation of CMOS technologies and the trend is expected to get worse. A significant frac...
IOLTS
2007
IEEE
13 years 11 months ago
2007
IEEE
Soft error due to ionizing radiation is emerging as a major concern for future technologies. The measurement unit for failures due to soft errors is called Failure-In-Time (FIT) t...