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ISQED
2007
IEEE
13 years 12 months ago
2007
IEEE
Negative bias temperature instability (NBTI) has come to the forefront of critical reliability phenomena in advanced CMOS technology. In this paper, we propose a fast and accurate...
ISQED
2007
IEEE
13 years 12 months ago
2007
IEEE
In this paper, we propose a new approach to enforcing the passivity of a reduced system of general passive linear time invariant circuits. Instead of making the reduced models pas...
ISQED
2007
IEEE
13 years 12 months ago
2007
IEEE
Due to the roaring power dissipation and gaining popularity of 3D integration, thermal dissipation has been a critical concern of modern VLSI design. The availability for chip-lev...
ISQED
2007
IEEE
13 years 12 months ago
2007
IEEE
Straining of silicon improves mobility of carriers resulting in speed enhancement for transistors in CMOS technology. Traditionally, silicon straining is applied in a similar ad-h...
ISQED
2007
IEEE
13 years 12 months ago
2007
IEEE
We present a novel technique to exploit the power-performance tradeoff. The technique can be used stand-alone or in conjunction with dynamic voltage scaling, the mainstream techn...