Modern CMOS manufacturing processes have significant variability, which necessitates guard banding to achieve reasonable yield. It is our thesis that variability should be addres...
For effective digital rights management (DRM) of multimedia in the framework of embedded systems, both watermarking and cryptography are necessary. In this paper, we present a wat...
Saraju P. Mohanty, Elias Kougianos, Wei Cai, Manis...
An on-chip test-and-measurement system with digital interfaces that can perform device-level characterization of large-dense arrays of transistors is demonstrated in 90- and 65-nm...
Simeon Realov, William McLaughlin, Kenneth L. Shep...
As technology advances, the interconnect delay among modules plays dominant role in chip performance. Buffer insertion, as a traditional approach to reduce wire delay in 2D ICs, i...
—As device feature size continues to shrink, reliability becomes a severe issue due to process variation, particle-induced transient errors, and transistor wear-out/stress such a...
Jin Sun, Avinash Karanth Kodi, Ahmed Louri, Janet ...