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ITC
1993
IEEE
13 years 9 months ago
1993
IEEE
ITC
1993
IEEE
13 years 9 months ago
1993
IEEE
ITC
1993
IEEE
13 years 9 months ago
1993
IEEE
Built-In-Self-Test BIST for VLSI systems is desirable in order to reduce the cost per chip of production-time testing by the manufacturer. In addition, it can provide the means ...
ITC
1993
IEEE
13 years 9 months ago
1993
IEEE
This paper describes a technique which uses the Differential Non Linearity (DNL) test data for fault location and identification of the analog components of a flash ADC. In a flash...
ITC
1993
IEEE
13 years 9 months ago
1993
IEEE
This paper presents an efficient approach to generate tests for gate delay faults. Unlike other known algorithms which try to generate a 'good' delay test the presented ...