25 search results - page 5 / 5 » itc 2002 |
ITC
2002
IEEE
13 years 9 months ago
2002
IEEE
1 Scan based transition tests are added to improve the detection of speed failures using scan tests. Empirical data suggests that both data volume and application time, for transi...
ITC
2002
IEEE
13 years 9 months ago
2002
IEEE
Significant reductions in test application times can be achieved through parallelizing core tests; however, simultaneous test of various cores may result in exceeding power thres...
ITC
2002
IEEE
13 years 9 months ago
2002
IEEE
Efficient production testing is frequently hampered because current digital circuits require test sets which are too large. These test sets can be reduced significantly by means...
ATS
2004
IEEE
13 years 8 months ago
2004
IEEE
Conventional serial connection of internal scan chains brings the power and time penalty. A novel parallel core wrapper design (pCWD) approach is presented in this paper for reduc...
ICCAD
2002
IEEE
14 years 1 months ago
2002
IEEE
This work presents several new techniques for enhancing the performance of deterministic test pattern generation for VLSI circuits. The techniques introduced are called dynamic de...