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VTS
2003
IEEE
13 years 10 months ago
2003
IEEE
— In this paper, we study the problem of delay defect diagnosis based on statistical timing models. We propose a diagnosis algorithm that can effectively utilize statistical timi...
DATE
2003
IEEE
13 years 10 months ago
2003
IEEE
Abstract — This paper defines a new diagnosis problem for diagnosing delay defects based upon statistical timing models. We illustrate the differences between the delay defect d...
ISQED
2003
IEEE
13 years 10 months ago
2003
IEEE
A structurally testable delay fault might become untestable in the functional mode of the circuit due to logic or timing constraints or both. Experimental data suggests that there...
ITC
2003
IEEE
13 years 10 months ago
2003
IEEE
This paper describes a new post-silicon validation problem for diagnosing systematic timing errors. We illustrate the differences between timing validation and the traditional log...
ITC
2003
IEEE
13 years 10 months ago
2003
IEEE
In this paper, we study the possibility of using logic defect-level prediction models to predict the detection behavior of statistical timing defects. We compare two known logic m...