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DAC
2008
ACM
14 years 6 months ago
Study of the effects of MBUs on the reliability of a 150 nm SRAM device
1 Soft errors induced by radiation are an increasing problem in the microelectronic field. Although traditional models estimate the reliability of memories suffering Single Event U...
Juan Antonio Maestro, Pedro Reviriego
ISQED
2008
IEEE
186views Hardware» more  ISQED 2008»
13 years 11 months ago
Reliability-Aware Optimization for DVS-Enabled Real-Time Embedded Systems
—Power and energy consumption has emerged as the premier and most constraining aspect in modern computational systems. Dynamic Voltage Scheduling (DVS) has been provably one of t...
Foad Dabiri, Navid Amini, Mahsan Rofouei, Majid Sa...
BCS
2008
13 years 6 months ago
Hardware Dependability in the Presence of Soft Errors
Using formal verification for designing hardware designs free from logic design bugs has been an active area of research since the last 15 years. Technology has matured and we hav...
Ashish Darbari, Bashir M. Al-Hashimi
TCAD
2008
172views more  TCAD 2008»
13 years 4 months ago
General Methodology for Soft-Error-Aware Power Optimization Using Gate Sizing
Power consumption has emerged as the premier and most constraining aspect in modern microprocessor and application-specific designs. Gate sizing has been shown to be one of the mos...
Foad Dabiri, Ani Nahapetian, Tammara Massey, Miodr...