Abstract--A distributed on-chip decoupling capacitor network is proposed in this paper. A system of distributed on-chip decoupling capacitors is shown to provide an efficient solut...
Mikhail Popovich, Eby G. Friedman, Radu M. Secarea...
Subthreshold circuit designs have been demonstrated to be a successful alternative when ultra-low power consumption is paramount. However, the characteristics of MOS transistors in...
John Keane, Hanyong Eom, Tae-Hyoung Kim, Sachin S....
— Excessive instantaneous power consumption may reduce the reliability and performance of VLSI chips. Hence, to synthesize circuits with high reliability, it is imperative to efï...
— Fault-tolerance is an important system metric for many operating environments, from automotive to space exploration. The conventional technique for improving system reliability...
John Lach, William H. Mangione-Smith, Miodrag Potk...
Abstract—Pseudoexhaustive testing involves applying all possible input patterns to the individual output cones of a combinational circuit. Based on our new algebraic results, we ...
Rajagopalan Srinivasan, Sandeep K. Gupta, Melvin A...