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TVLSI
2008
106views more  TVLSI 2008»
13 years 4 months ago
Efficient Distributed On-Chip Decoupling Capacitors for Nanoscale ICs
Abstract--A distributed on-chip decoupling capacitor network is proposed in this paper. A system of distributed on-chip decoupling capacitors is shown to provide an efficient solut...
Mikhail Popovich, Eby G. Friedman, Radu M. Secarea...
TVLSI
2008
74views more  TVLSI 2008»
13 years 4 months ago
Stack Sizing for Optimal Current Drivability in Subthreshold Circuits
Subthreshold circuit designs have been demonstrated to be a successful alternative when ultra-low power consumption is paramount. However, the characteristics of MOS transistors in...
John Keane, Hanyong Eom, Tae-Hyoung Kim, Sachin S....
TVLSI
1998
81views more  TVLSI 1998»
13 years 4 months ago
Maximum power estimation for CMOS circuits using deterministic and statistical approaches
— Excessive instantaneous power consumption may reduce the reliability and performance of VLSI chips. Hence, to synthesize circuits with high reliability, it is imperative to efï...
Chuan-Yu Wang, Kaushik Roy
TVLSI
1998
83views more  TVLSI 1998»
13 years 4 months ago
Low overhead fault-tolerant FPGA systems
— Fault-tolerance is an important system metric for many operating environments, from automotive to space exploration. The conventional technique for improving system reliability...
John Lach, William H. Mangione-Smith, Miodrag Potk...
TVLSI
1998
95views more  TVLSI 1998»
13 years 4 months ago
Bounds on pseudoexhaustive test lengths
Abstract—Pseudoexhaustive testing involves applying all possible input patterns to the individual output cones of a combinational circuit. Based on our new algebraic results, we ...
Rajagopalan Srinivasan, Sandeep K. Gupta, Melvin A...