77 search results - page 3 / 16 » vlsid 2002 |
VLSID
2002
IEEE
14 years 5 months ago
2002
IEEE
We describe a built-in test pattern generation method for scan circuits. The method is based on partitioning and storage of test sets. Under this method, a precomputed test set is...
VLSID
2002
IEEE
14 years 5 months ago
2002
IEEE
The paper presents two new approaches to multiobjective design space exploration for parametric VLSI systems. Both considerably reduce the number of simulations needed to determin...
VLSID
2002
IEEE
14 years 5 months ago
2002
IEEE
The radiation and surface wave losses may give rise to electromagnetic interference (EMI) problems in high speed VLSI interconnects. Over and above there will be dielectric and co...
VLSID
2002
IEEE
14 years 5 months ago
2002
IEEE
As a basic cell of arithmetic circuits, a one-bit full adder and a counter are usually used. Minimizing power consumption of these components is a key issue for low-power circuit ...
VLSID
2002
IEEE
14 years 5 months ago
2002
IEEE
This paper presents the applicability of a cosimulation methodology based on an object-oriented simulation environment, to multi-domain and multi-language systems design. This met...