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ATS
2005
IEEE
164views Hardware» more  ATS 2005»
9 years 7 months ago
A Family of Logical Fault Models for Reversible Circuits
Reversibility is of interest in achieving extremely low power dissipation; it is also an inherent design requirement of quantum computation. Logical fault models for conventional ...
Ilia Polian, Thomas Fiehn, Bernd Becker, John P. H...
ATS
2005
IEEE
91views Hardware» more  ATS 2005»
9 years 11 months ago
Design for Testability Based on Single-Port-Change Delay Testing for Data Paths
Yuki Yoshikawa, Satoshi Ohtake, Michiko Inoue, Hid...
ATS
2005
IEEE
191views Hardware» more  ATS 2005»
9 years 11 months ago
Low Transition LFSR for BIST-Based Applications
Abstract—This paper presents a low transition test pattern generator, called LT-LFSR, to reduce average and peak power of a circuit during test by reducing the transitions within...
Mohammad Tehranipoor, Mehrdad Nourani, Nisar Ahmed
ATS
2005
IEEE
98views Hardware» more  ATS 2005»
9 years 11 months ago
Untestable Multi-Cycle Path Delay Faults in Industrial Designs
The need for high-performance pipelined architectures has resulted in the adoption of latch based designs with multiple, interacting clocks. For such designs, time sharing across ...
Manan Syal, Michael S. Hsiao, Suriyaprakash Natara...
ATS
2005
IEEE
100views Hardware» more  ATS 2005»
9 years 11 months ago
A Methodology to Compute Bounds on Crosstalk Effects in Arbitrary Interconnects
In this paper, we present a methodology that uses the moments of a generic crosstalk pulse signal to derive upper bounds on the amplitude of crosstalk pulse in arbitrary interconn...
Wichian Sirisaengtaksin, Sandeep K. Gupta
ATS
2005
IEEE
104views Hardware» more  ATS 2005»
9 years 11 months ago
Leakage Current Based Stabilization Scheme for Robust Sense-Amplifier Design for Yield Enhancement in Nano-scale SRAM
In this paper, we develop a method to analyze the probability of access failure in SRAM array (due to random Vt variation in transistors) by jointly considering variations in cell...
Saibal Mukhopadhyay, Arijit Raychowdhury, Hamid Ma...
ATS
2005
IEEE
84views Hardware» more  ATS 2005»
9 years 11 months ago
Current Testing for Nanotechnologies: A Demystifying Application Perspective.
: This paper addresses the challenges imposed on current testing with the advent of Nanotechnologies. It shows why existing measurement solutions embedded in ATE systems are not ad...
Hans A. R. Manhaeve
ATS
2005
IEEE
100views Hardware» more  ATS 2005»
9 years 11 months ago
Finite State Machine Synthesis for At-Speed Oscillation Testability
In this paper, we propose an oscillation-based test methodology for sequential testing. This approach provides many advantages over traditional methods. (1) It is at-speed testing...
Katherine Shu-Min Li, Chung-Len Lee, Tagin Jiang, ...
ATS
2005
IEEE
91views Hardware» more  ATS 2005»
9 years 11 months ago
SOC Test Scheduling with Test Set Sharing and Broadcasting
11 Due to the increasing test data volume needed to test corebased System-on-Chip, several test scheduling techniques minimizing the test application time have been proposed. In co...
Anders Larsson, Erik Larsson, Petru Eles, Zebo Pen...
ATS
2005
IEEE
144views Hardware» more  ATS 2005»
9 years 11 months ago
On Detection of Resistive Bridging Defects by Low-Temperature and Low-Voltage Testing
—Test application at reduced power supply voltage (low-voltage testing) or reduced temperature (low-temperature testing) can improve the defect coverage of a test set, particular...
Sandip Kundu, Piet Engelke, Ilia Polian, Bernd Bec...
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