GLVLSI
2005
IEEE
13 years 10 months ago
2005
IEEE
The ever-increasing number of transistors on a chip has resulted in very large scale integration (VLSI) systems whose performance and manufacturing costs are driven by on-chip wir...
DFT
2007
IEEE
13 years 11 months ago
2007
IEEE
Decreasing feature sizes have led to an increased vulnerability of random logic to soft errors. A particle strike may cause a glitch or single event transient (SET) at the output ...
ICCAD
2003
IEEE
14 years 1 months ago
2003
IEEE
This paper introduces a CAD framework for co-simulation of hybrid circuits containing CMOS and SET (Single Electron Transistor) devices. An improved analytical model for SET is al...