DAC
2005
ACM
13 years 7 months ago
2005
ACM
Reliability of nanometer circuits is becoming a major concern in today’s VLSI chip design due to interferences from multiple noise sources as well as radiation-induced soft erro...
DAC
2005
ACM
13 years 7 months ago
2005
ACM
DAC
2005
ACM
13 years 7 months ago
2005
ACM
This paper presents a new method for designing test wrappers for embedded cores with multiple clock domains. By exploiting the use of multiple shift frequencies, the proposed meth...
DAC
2005
ACM
13 years 7 months ago
2005
ACM
This paper presents a new Green function-based approach for substrate parasitic extraction in substrates with inhomogeneous layers. This new formulation allows analysis of noise c...
DAC
2005
ACM
13 years 7 months ago
2005
ACM
Grid-warping is a recent placement strategy based on a novel physical analogy: rather than move the gates to optimize their location, it elastically deforms a model of the 2-D chi...
DAC
2005
ACM
13 years 7 months ago
2005
ACM
DAC
2005
ACM
13 years 7 months ago
2005
ACM
DAC
2005
ACM
13 years 7 months ago
2005
ACM
We propose a normalization technique for verifying arithmetic circuits in a bounded model checking environment. Our technique operates on the arithmetic bit level (ABL) descriptio...
DAC
2005
ACM
13 years 7 months ago
2005
ACM
This paper presents a new test response compaction technique with any number of unknown logic values (X’s) in the test response bits. The technique leverages an X-tolerant respo...
DAC
2005
ACM
13 years 7 months ago
2005
ACM
For the past 25 years, the EDA industry has played a major role in the growth of the semiconductor industry, providing tools and services that have helped companies develop electr...