DATE
2005
IEEE
13 years 10 months ago
2005
IEEE
— With increasing process fluctuations in nano-scale technology, testing for delay faults is becoming essential in manufacturing test to complement stuck-at-fault testing. Desig...
DATE
2005
IEEE
13 years 10 months ago
2005
IEEE
The purpose of this paper is to formally specify a flow devoted to the design of Differential Power Analysis (DPA) resistant QDI asynchronous circuits. The paper first proposes a ...
DATE
2005
IEEE
13 years 10 months ago
2005
IEEE
We present a hybrid BIST approach that extracts the most frequently occurring sequences from deterministic test patterns; these extracted sequences are stored on-chip. We use clus...
DATE
2005
IEEE
13 years 10 months ago
2005
IEEE
Supply voltage scaling and adaptive body-biasing are important techniques that help to reduce the energy dissipation of embedded systems. This is achieved by dynamically adjusting...
DATE
2005
IEEE
13 years 10 months ago
2005
IEEE
The increasing complexity and the short life cycles of embedded systems are pushing the current system-onchip designs towards a rapid increasing on the number of programmable proc...
DATE
2005
IEEE
13 years 10 months ago
2005
IEEE
We discuss the problem of Concurrent Error Detection (CED) in a popular class of asynchronous controllers, namely Burst-Mode machines. We first outline the particularities of the...
DATE
2005
IEEE
13 years 10 months ago
2005
IEEE
In this paper, we present an experimental integrated platform for the research, development and evaluation of new VLSI back-end algorithms and design flows. Interconnect scaling ...
DATE
2005
IEEE
13 years 10 months ago
2005
IEEE
Instruction Level Parallelism (ILP) extraction for multicluster VLIW processors is a very hard task. In this paper, we propose a retargetable architecture that can exploit ILP and...
DATE
2005
IEEE
13 years 10 months ago
2005
IEEE
DATE
2005
IEEE
13 years 10 months ago
2005
IEEE
