DATE
2008
IEEE
13 years 11 months ago
2008
IEEE
In sub-90nm process technology it becomes harder to control the fabrication process, which in turn causes variations between the design-time parameters and the fabricated paramete...
DATE
2008
IEEE
13 years 11 months ago
2008
IEEE
DATE
2008
IEEE
13 years 11 months ago
2008
IEEE
— Criticality and yield gradients are two crucial diagnostic metrics obtained from Statistical Static Timing Analysis (SSTA). They provide valuable information to guide timing op...
DATE
2008
IEEE
13 years 11 months ago
2008
IEEE
We present the implementation and analysis of a variation tolerant version of a switch-to-switch link in a NoC. The goal is to tolerate the effects of process variations on NoC ar...
DATE
2008
IEEE
13 years 11 months ago
2008
IEEE
Constant-coefficient multipliers are fundamental components in digital signal processing and arithmetic-based systems. Their verification, however, remains difficult and time-cons...
DATE
2008
IEEE
13 years 11 months ago
2008
IEEE
Token passing is a channel access technique used in several communication networks. Among them, one of the most effective solution for supporting both real-time traffic (synchron...
DATE
2008
IEEE
13 years 11 months ago
2008
IEEE
DATE
2008
IEEE
13 years 11 months ago
2008
IEEE
A new algorithm is presented that combines performance and variation objectives in a behavioural model for a given analogue circuit topology and process. The tradeoffs between per...
DATE
2008
IEEE
13 years 11 months ago
2008
IEEE
DATE
2008
IEEE
13 years 11 months ago
2008
IEEE
This paper presents a wrapper and TAM co-optimization method for reuse of SoC functional interconnects to minimize test time under area constraint. The proposed method consists of...