DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
With aggressive gate oxide scaling, latent defects in the gate oxide manifest as traps that, in time, lead to gate oxide breakdown. Progressive gate oxide breakdown, also referred...
DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
— Pattern recognition has many applications in design automation. A generalized pattern recognition algorithm is presented in this paper which can efficiently extract similar pat...
DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
—In this paper we study the effectiveness of two power gating methods – transistor switches and MEMS switches – in reducing the power consumption of a design with a certain t...
DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
—Fault tolerance (FT) has become a major concern in computing systems. Instruction duplication has been proposed to verify application execution at run time. Two techniques, inst...
DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
— Though tag bits in the data caches are vulnerable to transient errors, few effort has been made to reduce their vulnerability. In this paper, we propose to exploit prevalent sa...
DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
Modern FPGAs have been designed with advanced integrated circuit techniques that allow high speed and low power performance, joined to reconfiguration capabilities. This makes new...