DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
—Synchronous languages offer a deterministic model of concurrency at the level of actions. However, essentially all compilers for synchronous languages compile these actions into...
DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
—As Electronic Control Units (ECUs) and embedded software functions within an automobile keep increasing in number, the scale and complexity of automotive embedded systems is gro...
DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
—We present Huckleberry, a tool for automatically generating parallel implementations for multi-core platforms from sequential recursive divide-and-conquer programs. The recursiv...
DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
—1 In this paper we present a stochastic model order reduction technique for interconnect extraction in the presence of process variabilities, i.e. variation-aware extraction. It...
DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
—The admission control problem is concerned with determining whether a new task may be accepted by a system consisting of a set of running tasks, such that the already admitted a...
DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
—Inductive and capacitive coupling are responsible for slowing down signals. Existing bus encoding techniques tackle the issue by avoiding certain types of transitions. This work...
DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
—Daily experience with product designers, test and diagnosis engineers it is realized that the depth of interaction among them, ought be high for sucessfull diagnosis of analogue...
DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
—Scalable cache coherence is imperative as systems move into the many-core era with cores counts numbering in the hundreds. Directory protocols are often favored as more scalable...
DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
—This paper describes a system-level modeling method in UML for performance evaluation of embedded systems. The core technology of this modeling method is reverse modeling based ...
DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
—Time-dependent performance degradation due to transistor aging caused by mechanisms such as Negative Bias Temperature Instability (NBTI) and Hot Carrier Injection (HCI) is one o...