DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
—Associated with the ever growing integration scales is the increase in process variability. In the context of networkon-chip, this variability affects the maximum frequency that...
DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
—This paper presents a robust, low-cost ADC code hit counting technique to record the number of times each ADC output code word appears with respect to the ramp input. Using a sm...
DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
—This paper presents a methodology to evaluate and optimize the robustness of an embedded system in terms of invariability in case of design revisions. Early decisions in embedde...
DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
— This paper describes a Model Order Reduction algorithm for multi-dimensional parameterized systems, based on a sampling procedure which incorporates a low order moment matching...
DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
— Today, mobile and embedded real time systems have to cope with the migration and allocation of multiple software tasks running on top of a real time operating system (RTOS) res...
DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
—Energy consumption is a critical parameter in wireless healthcare systems which consist of battery operated devices such as sensors and local aggregators. The system battery lif...
DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
— We propose a methodology for Boolean matching under permutations of inputs and outputs (PP-equivalence checking problem) — a key step in incremental logic design that identif...
DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
—This paper presents a design space exploration of a selective load value prediction scheme suitable for energyaware Simultaneous Multi-Threaded (SMT) architectures. A load value...
DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
—The success of server virtualization has let to the deployment of a huge number of virtual machines in today’s data centers, making a manual virtualization management very lab...
DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
: Scaling down in very deep submicron (VDSM) technologies increases the delay, power consumption of on-chip interconnects, while the reliability and yield decrease. In high perform...