The paper presents a test pattern generation and fault simulation methodology for the detection of catastrophic faults in analogue circuits. The test methodology chosen for evalua...
Stephen J. Spinks, Chris D. Chalk, Ian M. Bell, Ma...
Recent increases in the density and size of memory ICs made it ne cessary to search for new defect tolerance techniques since the traditional methods are no longer e ective enough...
Abstract— Error control is a major concern in many computer systems, particularly those deployed in critical applications. Experience shows that most malfunctions during system o...
Christopher G. Knight, Adit D. Singh, Victor P. Ne...
Crosstalk has become a major issue in VLSI design due to the high frequency, long interconnecting lines and small spacing between interconnects in today's integrated circuits...