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DFT
2008
IEEE
106views VLSI» more  DFT 2008»
13 years 11 months ago
Built-In Proactive Tuning System for Circuit Aging Resilience
VLSI circuits in nanometer VLSI technology experience significant aging effects, which are embodied by performance degradation over operation time. Although this degradation can b...
Nimay Shah, Rupak Samanta, Ming Zhang, Jiang Hu, D...
DFT
2008
IEEE
120views VLSI» more  DFT 2008»
13 years 11 months ago
Built-in-Self-Diagnostics for a NoC-Based Reconfigurable IC for Dependable Beamforming Applications
Integrated circuits (IC) targeting at the streaming applications for tomorrow are becoming a fast growing market. Applications such as beamforming require mass computing capabilit...
Oscar Kuiken, Xiao Zhang, Hans G. Kerkhoff
DFT
2008
IEEE
138views VLSI» more  DFT 2008»
13 years 11 months ago
Exploring Density-Reliability Tradeoffs on Nanoscale Substrates: When do smaller less reliable devices make sense?
It is widely recognized that device and interconnect fabrics at the nanoscale will be characterized by an increased susceptibility to transient faults. This appears to be intrinsi...
Andrey V. Zykov, Gustavo de Veciana