CHES
2011
Springer
12 years 5 months ago
2011
Springer
RSA-CRT fault attacks have been an active research area since their discovery by Boneh, DeMillo and Lipton in 1997. We present alternative key-recovery attacks on RSA-CRT signature...
TCAD
2008
13 years 5 months ago
2008
At-speed functional testing, delay testing, and n-detection test sets are being used today to detect deep submicrometer defects. However, the resulting test data volumes are too hi...
ECAI
2010
Springer
13 years 6 months ago
2010
Springer
The paper describes a model-based approach to developing a general tool for localizing faults in applications of data warehouse technology. A model of the application is configured...
AAAI
1990
13 years 6 months ago
1990
In this paper we describe the concept of physical impossibility as an alternative to the specification of fault models. These axioms can be used to exclude impossible diagnoses si...
PTS
2007
13 years 6 months ago
2007
Black-box testing is a popular technique for assessing the quality of a system. However, in case of a test failure, only little information is available to identify the root-cause ...
DAC
2006
ACM
13 years 7 months ago
2006
ACM
Software-based self-test (SBST) has recently emerged as an effective methodology for the manufacturing test of processors and other components in systems-on-chip (SoCs). By moving ...
ITC
1991
IEEE
13 years 8 months ago
1991
IEEE
Two approaches have been used to balance the cost of generating e ective tests for ICs and the need to increase the ICs' quality level. The rst approach favorsusing high-leve...
EURODAC
1995
IEEE
13 years 8 months ago
1995
IEEE
This paper presents a formal approach to test combinational circuits. For the sake of explanation we describe the basic algorithms with the help of the stuck–at fault model. Ple...
CHES
2006
Springer
13 years 8 months ago
2006
Springer
Abstract. In this paper we describe two differential fault attack techniques against Advanced Encryption Standard (AES). We propose two models for fault occurrence; we could find a...
ITC
1994
IEEE
13 years 9 months ago
1994
IEEE
: The IC test industry has struggled .for more than 30years to establish a test approach that would guarantee a low defect level to the customer. Wepropose a comprehensive strategy...