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DAGSTUHL
2006
8 years 11 months ago
XPathMark: Functional and Performance Tests for XPath
We present a major revision of the XPath benchmark known as XPathMark [1]. The new version splits into a functional test over a small educational document and a more elaborated per...
Massimo Franceschet
DATE
2000
IEEE
139views Hardware» more  DATE 2000»
9 years 2 months ago
A VHDL Error Simulator for Functional Test Generation
This paper describes an ef´Čücient error simulator able to analyze functional VHDL descriptions. The proposed simulation environment can be based on commercial VHDL simulators. Al...
Alessandro Fin, Franco Fummi
GLVLSI
2005
IEEE
133views VLSI» more  GLVLSI 2005»
9 years 4 months ago
Generating decision regions in analog measurement spaces
We develop a neural network that learns to separate the nominal from the faulty instances of a circuit in a measurement space. We demonstrate that the required separation boundari...
Haralampos-G. D. Stratigopoulos, Yiorgos Makris
ATS
2005
IEEE
121views Hardware» more  ATS 2005»
9 years 4 months ago
Compressing Functional Tests for Microprocessors
In the past, test data volume reduction techniques have concentrated heavily on scan test data content. However, functional vectors continue to be utilized because they target uni...
Kedarnath J. Balakrishnan, Nur A. Touba, Srinivas ...
GLVLSI
2007
IEEE
189views VLSI» more  GLVLSI 2007»
9 years 4 months ago
Hardware-accelerated path-delay fault grading of functional test programs for processor-based systems
The path-delay fault simulation of functional tests on complex circuits such as current processor-based systems is a daunting task. The amount of computing power and memory needed...
Paolo Bernardi, Michelangelo Grosso, Matteo Sonza ...
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